Virtual Microscopy Interactive Tutorials

• Scanning Electron Microscopy

  We have teamed up with award-winning electron microscopist Dr. Dennis Kunkel to produce a series of interactive Java tutorials that explore various aspects of virtual Scanning Electron Microscopy (vSEM).

• Translational Microscopy

  The featured interactive tutorial simulates scanning of a sample under the microscope at a fixed magnification. The sample can be translated back and forth while observing a small portion in the viewfield.

• Magnifying Microscopy

  Explore and learn more about the effect of increasing magnification (equivalent to changing microscope objectives) on the ability to resolve features in a sample in this interactive java tutorial.

• Laser Scanning Confocal Microscopy

  Laser scanning confocal microscopes employ a pair of pinhole apertures to limit the specimen focal plane to a confined volume approximately a micron in size as featured in this interactive tutorial.

• Microscopy of Silicon Artwork

  Examine integrated circuits in brightfield, darkfield, and differential interference contrast (DIC) reflected illumination to explore how silicon artwork is photographed in this interactive java tutorial.

• Phase Plate/Ring Alignment

  Concentric alignment of the condenser phase plate slits with the phase ring is important in phase contrast microscopy. Explore the effect of phase plate/ring alignment on specimen contrast using this technique.

• Reflected Light Confocal Microscopy

  Explore real-time confocal imaging of integrated circuits with reflected light confocal microscopy. Instructions for operation of the tutorial are given beneath the applet window.

• Polarized Light Microscopy

  Polarized light microscopy is a useful method to generate contrast in birefringent specimens and to determine qualitative and quantitative aspects of crystallographic axes present in various materials.

• Microscopy of the Silicon Zoo

  Observe and examine various entries in the Silicon Zoo that were photographed under conditions of differential interference contrast (DIC) illumination with a retardation plate in the light path.

• Hoffman Modulation Contrast Microscopy

  Discover and explore how rotation of the substage polarizing filter affects image contrast in Hoffman modulation contrast microscopy in this interactive java tutorial.

• Rheinberg Illumination (Optical Staining) Microscopy

  Explore how specimen appearance is altered with color changes in both the central and annular filters in a virtual microscope equipped with Rheinberg illumination.

• Differential Interference Contrast Microscopy (DIC)

  The DIC interactive java tutorial explores how changes in the orientation the polarizer in a Senarmont compensation system will affect image contrast.

• Depth-of-Focus in Thick Samples

  The featured simulated-DIC interactive Java tutorial allows the visitor to investigate how microscope depth-of-focus can be modulated to bring various parts of a very thick specimen into sharp focus.

• Fluorescence Microscopy with Multiple Fluorochromes

  Explore the effects of fluorescence cube filtration of excitation/emission spectra on specimens stained with multiple fluorochromes.

• Fluorescence Combination Microscopy

  Simulated in this tutorial is the combination of fluorescence microscopy with either phase contrast or differential interference contrast (DIC) microscopy. Toggle between views of the various techniques to produce contrast effects.